STDF to Wafer Bin Map utility written in Python
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Jul 12, 2018 - Python
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wafer-map
Here are 18 public repositories matching this topic...
Python utilities for loading, plotting, and editing wafer defect maps known as KLA Reference Files (KLARFs)
python data-science data-visualization defects semiconductor wafer 001 wafer-map kla applied-materials klarf wafers
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Jul 18, 2026 - Python
a kibana plugin to visualize the wafer map
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Aug 29, 2019 - JavaScript
This project aims to process 2D images of semiconductor silicon wafers to identify any defects on the wafers as well as their corresponding locations.
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May 9, 2023 - Python
산학협력프로젝트: 머신러닝 기반 Wafer Map Defect Pattern Identification
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Dec 21, 2020 - Python
Wafer map defect pattern classification with Multi-Input Neural Network using Convolutioal and Handcrafted Features
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Feb 23, 2022 - Python
Interactive wafer map visualization and yield analysis for semiconductor test data. Rendering, spatial statistics, failure clustering, lot-level trends, and reticle analysis — pure ES modules, no dependencies.
react visualization javascript typescript canvas vue plotly svelte spatial-analysis ate semiconductor stdf prober wafermap wafer-map bin-map yield-analysis die-map wafer-yield
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Aug 17, 2026 - TypeScript
Mask-aware wafer defect classification using a DenseNet-based CNN with explicit geometry masking and Grad-CAM explainability.
computer-vision deep-learning grad-cam cnn pytorch densenet explainable-ai semiconductor-manufacturing wafer-map wafer-defect-detection
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Jan 4, 2026 - Jupyter Notebook
Utility script for visualization of wafer properties from measurement data, intended for wafer evaluation in process development and production workflows.
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Jan 11, 2026 - Python
Utility script for generating wafer-level measurement point layouts with configurable patterns and edge exclusion, designed for semiconductor process development and production workflows.
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Mar 1, 2026 - Python
EFA-aware wafer map failure pattern classification on WM-811K — calibrated confidence, selective prediction, honest evaluation
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Jul 11, 2026 - Python
Utility script for visualization of wafer properties from measurement data, intended for wafer evaluation in process development and production workflows.
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Jan 14, 2026 - Python
Wafer Map Defect Classification using Deep Convolutional Neural Networks (CNN) with TensorFlow/Keras on the WM-811K dataset.
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Feb 8, 2026 - HTML
Automatic scratch detection in semiconductor wafer maps using engineered spatial features and XGBoost.
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Sep 4, 2025 - Jupyter Notebook
Multimodal agentic pipeline for industrial defect triage. A vision model classifies wafer map or surface defects, retrieves similar historical cases, an LLM reasons about root cause, and a reporter agent drafts a disposition, with confidence-gated hand-off to a human reviewer.
python computer-vision pytorch semiconductor anomaly-detection onnx sagemaker defect-detection rag mlops mlflow wafer-map root-cause-analysis fastapi streamlit llm vllm llm-agents langgraph agentic-ai
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Jul 20, 2026 - Jupyter Notebook
ResNet-18 wafer defect classifier trained on WM-811K — focal loss, CBAM attention, TTA, and Grad-CAM++ explainability. Macro-F1 0.916 on the 9-class labeled subset.
computer-vision deep-learning grad-cam pytorch image-classification resnet class-imbalance attention-mechanism semiconductor explainable-ai focal-loss wafer-map cbam test-time-augmentation supervised-classification defect-classification wm-811k manufacturing-ai wafer-defect-detection
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Jul 5, 2026 - Python
Interpretable wafer-map classification with spatial signatures, calibrated confidence and similar-case retrieval.
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Aug 5, 2026 - Python
Semiconductor DMI yield intelligence platform for class-imbalanced defect detection, wafer-map simulation, and chamber traceback
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Jun 18, 2026 - Jupyter Notebook
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