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computational-lithography

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Open Source EUV Lithography Simulator — from plasma source to CD metrology. Full-stack simulation: LPP Sn plasma → RCWA mask diffraction → TMM multilayer optics → Hopkins aerial imaging → Dill ABC resist chemistry → CD metrology. Apache 2.0.

  • Updated Jul 22, 2026
  • Jupyter Notebook

广东工业大学2025届本科毕业设计创新奖作品。This repository presents a 2025 undergraduate thesis from Guangdong University of Technology (Automation). It proposes a GNN-based lithography hotspot detection algorithm for IC layouts, received the Outstanding Innovation Award.

  • Updated Mar 28, 2026
  • Python

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