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services/test: Add the mock BMC boot model - #536

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chrysh wants to merge 3 commits into
OpenPRoT:ocp-global-demo-wipfrom
9elements:mock-bmc-model
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chrysh wants to merge 3 commits into
OpenPRoT:ocp-global-demo-wipfrom
9elements:mock-bmc-model

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@chrysh

@chrysh chrysh commented Oct 3, 2026

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Review the last commit only. The two before it are #532 and #533; the
fork cannot host a real stack.

Something has to sit on the other end of the RoT's reset and ready lines
for a boot-sequence test. This is that device: held in reset the ready
line stays inactive, and once reset is released it goes active after a
delay, or never.

Generic over InputPin and OutputPin, so the lines can be GPIO on a board
or whatever the wiring supplies in a test image. Time arrives as an
argument to poll and nothing waits, so the same model runs from a kernel
event loop or from a test that moves the clock by hand.

Boots and Hangs are the only behaviours. A late boot is Boots with a
delay past the window the RoT waits, which makes lateness a property of
the deadline rather than of the device.

Assisted-by: Claude

chrysh added 3 commits October 3, 2026 13:58
The QEMU runner filled each FMC backing image with one byte, so a test
could hand the device erased flash and nothing else. The integration
test needs the device to already hold a firmware image the update agent
can offer.

cs0_contents and cs1_contents name a file to copy in at offset 0; the
remainder stays 0xFF. Without them the fill byte behaves as before, so
every existing test is unchanged.

A contents file longer than flash_size is an error rather than a
truncation. A half-written image still parses far enough to fail
verification, which would make a verify-failure scenario pass for the
wrong reason.

Assisted-by: Claude
A QEMU test that offers a firmware image needs that image on flash
before the guest boots. The harness can now seed a chip select from a
file; this makes the file.

The layout arrives as arguments but is built with the same Region, Slot
and ImageLayout constructors the board tables use, so a layout this tool
accepts is one the orchestrator would accept: unique slot ids, no
overlap, no zero-length region, nothing past the end of the offset
space. Re-deriving those rules here would let a test image drift from
what the firmware believes about the same flash.

Everything no image covers stays 0xFF, and a payload too large for its
slot is an error rather than a truncation.

The flash_image rule wraps the tool so a BUILD file can hand the result
straight to cs0_contents or cs1_contents.

Assisted-by: Claude
The QEMU integration test needs something on the other end of the RoT's
reset and ready lines. This is that device: held in reset the ready line
stays inactive, and once reset is released it goes active after a delay,
or never.

Generic over InputPin and OutputPin, so the lines can be GPIO on a board
or whatever the wiring supplies in a test image. Time arrives as an
argument to poll and nothing waits, so the same model runs from a kernel
event loop or from a test that moves the clock by hand.

Asserting reset drops the ready line and restarts the delay. The RoT has
to see evidence disappear when it resets a device, or a stale ready line
would answer for the new boot.

Boots and Hangs are the only behaviours. A late boot is Boots with a
delay past the window the RoT waits, which makes lateness a property of
the deadline rather than of the device.

Assisted-by: Claude

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